Section 3-1: Nanoscale Materials Characterization

Time: 13:30-15:10, October 26, 2012 (Friday) 

Dr. Yusheng Zhao, Professor, University of Nevada, USA

13:30-13:55

Keynote
Title: Structural Characterization for Understanding and Improvement of Semiconductor Nano-Photonic Devices
Dr. Holger Eisele, Professor, Technical University of Berlin, Germany

13:55-14:20

Keynote

Title: Comparative Nano-Mechanics Study under Extreme P-T Conditions
Dr. Yusheng Zhao, Professor, University of Nevada, USA

14:20-14:45

Title: Evaluation of Surface Properties of Dispersed Nano- and Micro-particles by Means of in Situ Visualization and Quantification of Separation Behaviour

Dr. Dietmar Lerche, Managing Director, LUM GmbH, Germany

14:45-15:10

Title: Image Enhancement Technology in a Scanning Electron Microscope: Hardware and Software Based
Dr. Dong Hwan Kim, Professor, Seoul National University of Science and Technology, Korea

15:10-15:30

Coffee Break

Section 3-2: Nanoscopy      

Time: 13:30-15:35, October 27, 2012 (Saturday) 

Dr. Hannes Lichte, Professor, Dresden University, Germany

Dr. Danilo Pescia, Professor, ETH Zurich, Switzerland

13:30-13:55

Title: Electron Holography: Measurement of Structures and Fields on a Nanometer Scale
Dr. Hannes Lichte, Professor, Dresden University, Germany

13:55-14:20

Title: Fundamental Aspects of Near Tip Scanning Electron Microscopy
Dr. Danilo Pescia, Professor, ETH Zurich, Switzerland

14:20-14:45

Title: Live Observation of the Growth of Graphene with High-Temperature STM
Dr. Guocai Dong, Research Fellow, Leiden University, Netherlands

14:45-15:10

Title: Atomic Force Microscopy for Analysis of Nanostructures and Soft Matter
Dr. Martin Munz, Senior Research Scientist, National Physical Laboratory, UK

15:10-15:30

Coffee Break

Section 3-3: Scanning Probe Microscopy in Nanoscience and Nanotechnology     

Time: 13:30-15:30, October 28, 2012 (Sunday) 

Dr. Lin Huang, Engineering Manager, Bruker Nano Surfaces Division, USA

13:30-13:55

Title: Characterization of Nanoscale Electronic and Mechanical Properties of Solution Processed Zinc Oxide Thin Film
Dr. Lin Huang, Engineering Manager, Bruker Nano Surfaces Division, USA

13:55-14:20

Title: Diffuse X-ray Scattering – A Non-destructive Approach towards Low Dimensional Nanostructures

Dr. Michael Hanke, Senior Scientist, Paul Drude Institute, Germany

14:20-14:45

Title: AFM-based Nano-palpation Technique -From Single Polymer Chain to Viscoelastic Surfaces-

Dr. Ken Nakajima, Associate Professor, Tohoku University, Japan

14:45-15:10

Title: Scanning Tunneling Microscopy for Nanoscale Imaging of the Surface Charge Ordering in Transition Metal Oxide Films
Dr. Agus Subagyo, Research Scientist, Hokkaido University, Japan

15:10-15:30

Coffee Break

Section 3-4: X-ray and Neutron in Nanoscience and Nanotech

Time: 15:30-16:45, October 28, 2012 (Sunday) 

Dr. Tibor Papp, Owner, Cambridge Scientific, Canada

13:30-13:55

Keynote

Title: Fundamental Parameter Method and Digital Signal Processing in X-ray Analyses
Dr. Tibor Papp, Owner, Cambridge Scientific, Canada

13:55-14:20

Title: Lab-based High Resolution X-ray Nano-tomography in Material and Energy Research

Dr. Leilei Yin, Research Scientist, University of Illinois at Urbana-Champaign, USA

14:20-14:45

Title: Development and Application of High-resolution X-ray Ptychography
Dr. Yukio Takahashi, Associate professor, Osaka University, Japan